Impact of Process Variation in Fault-Resilient Streaming Nanoprocessors
Publication Files
Publication Medium:
International Conference on Nano-Networks
pages
pp. 26–27
Year of Publication:
2008
Abstract
We show results from ongoing work studying the interaction of process variation and built-in fault resilience intended to handle defects. We find that built-in fault resilience decreases the negative effects of process variation on a streaming nanoprocessor design.