Nano-crossbar arrays have emerged to achieve high performance computing beyond the limits of current CMOS. They offer area and power efficiency in courtesy of their easyto-fabricate and dense physical

Continuous scaling of CMOS has been the major catalyst in miniaturization of integrated circuits (ICs) and crucial for global socio-economic progress. However, scaling to sub-20nm technologies is proving to be challenging as MOSFETs are reaching their fundamental limits and interconnection bottleneck is dominating IC operational power and performance. Migrating to 3-D, as a way to advance scaling, has eluded us due to inherent customization and manufacturing requirements in CMOS that are incompatible with 3-D organization.

With recent promising progress on nanoscale devices including semiconductor nanowires and nanowire crossbars, researchers are trying to explore the possibility of building nanoscale computing systems. We have designed a nanoscale application-specific architecture called NASIC, which is based on semiconductor nanowire grids and FETs at crosspoints. In this paper, we propose a built-in redundancy technique to tolerate the defects in our nanoscale architecture. Compared to other fault tolerance techniques, our solution has significant advantages including self-healing, higher density.

Recent research progress on nanoscale devices such as based on nanowire (NW) crossbars shows great promise towards building nanoscale computing systems. This paper is part of our ongoing effort to develop and evaluate highdensity, defect-tolerant architectures on such fabrics. Our designs are based on Nanoscale Application Specific ICs (NASICs), and are primarily targeted towards microprocessor datapaths. In this paper we propose a new dynamic circuit scheme that enables efficient pipelining and temporary data storage with a 2£ higher throughput than in previously published designs.

Most proposed architectures for nanoscale computing systems are based on a certain type of 2-level logic family, e.g., AND-OR, NOR-NOR, etc. In this paper, we propose a new fabric architecture that combines different logic families in the same nanofabric. To achieve this we apply very minor modifications on the way a nanogrid is controlled but without changing the basic manufacturing assumptions. This new hybrid 2-level logic based fabric yields higher density for the applications mapped to it. When fault tolerance techniques are added it significantly improves fault tolerance.