History
- Member for
- 11 years 9 months
MD Muwyid Khan
Publications
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IEEE Transactions on Nanotechnology ,
Vol. No. 11 ,
Issue No. 4 ,
pp. 720-730 ,
2012 ,
PDF -
in Proceedings of IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT) ,
pp. 79-85 ,
2011 ,
PDF