Thermal management is one of the critical challenges in 3D integrated circuits. Incorporating thermal optimizations during the circuit design stages requires a convenient automatic method of doing thermal characterization for feedback purposes. In this paper, we present a methodology, which supports thermal characterization by automatically extracting the steady-state thermal modeling resistance network from a post-placement physical design. The method follows a two-level hierarchical approach.

Parallel and monolithic 3D integration directions offer pathways to realize 3D integrated circuits (ICs) but still lead to layer-by-layer implementations, each functional layer being composed in 2D first. This mindset causes challenging connectivity, routing and layer alignment between layers when connected in 3D, with a routing access that can be even worse than 2D CMOS, which fundamentally limits their potential.

Conventional CMOS technology is reaching fundamental scaling limits, and interconnection bottleneck is dominating IC power and performance. Migrating to 3-D integrated circuits, though promising, has eluded us due to inherent customization and manufacturing requirements in CMOS that are incompatible with 3-D organization. Skybridge, a fine-grained 3-D IC fabric technology was recently proposed towards this aim, which offers a paradigm shift in technology scaling and design.

Probabilistic machine intelligence paradigms such as Bayesian Networks (BNs) are widely used in critical real-world applications. However they cannot be employed efficiently for large problems on conventional computing systems due to inefficiencies resulting from layers of abstraction and separation of logic and memory. We present an unconventional nanoscale magneto-electric machine paradigm, architected with the principle of physical equivalence to efficiently implement causal inference in BNs.

With recent promising progress on nanoscale devices including semiconductor nanowires and nanowire crossbars, researchers are trying to explore the possibility of building nanoscale computing systems. We have designed a nanoscale application-specific architecture called NASIC, which is based on semiconductor nanowire grids and FETs at crosspoints. In this paper, we propose a built-in redundancy technique to tolerate the defects in our nanoscale architecture. Compared to other fault tolerance techniques, our solution has significant advantages including self-healing, higher density.